Near Field Zone of an Integrated Circuit Exposed to an Electromagnetic Wave in a Waveguide

Starostenko, V. V.; Malishevskiı, S. V.; Taran, E. P.; Churyumov, G. I.
January 2003
Technical Physics Letters;Jan2003, Vol. 29 Issue 1, p29
Academic Journal
The electromagnetic field distribution in the vicinity of an integrated circuit was calculated based on a numerical solution of the problem of electromagnetic wave diffraction on a model metal-dielectric structure in a waveguide tract. Using the obtained field distributions, it is possible to calculate currents in the microstructural elements of integrated circuits and develop a thermoelectric model of degradation processes in such circuits under the action of pulsed electromagnetic fields.


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